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Zhang, Rui
Rostock : Universität , 2020
https://doi.org/10.18453/rosdok_id00002777
http://purl.uni-rostock.de/rosdok/id00002777
A chip based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micro to nano meters after fast thermal treatments becomes accessible. FSC provides crystallization/melting curves of the sample just imaged by AFM. A combined AFM-FSC device is described, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample.
Dissertation
Open Access
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