Universität Rostock, 2020
https://doi.org/10.18453/rosdok_id00002777
Abstract: A chip based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micro to nano meters after fast thermal treatments becomes accessible. FSC provides crystallization/melting curves of the sample just imaged by AFM. A combined AFM-FSC device is described, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample.
doctoral thesis free access
This work may only be used under the terms of the German Copyright Law (Urheberrechtsgesetz).