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Rui Zhang

Polymer nucleation and crystallization investigated by in situ combination of atomic force microscopy (AFM) and fast scanning calorimetry (FSC)

Universität Rostock, 2020

Abstract: A chip based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micro to nano meters after fast thermal treatments becomes accessible. FSC provides crystallization/melting curves of the sample just imaged by AFM. A combined AFM-FSC device is described, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample.

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